Standard presentations

Welcome to the space dedicated to ART-Fi presentations, carried out at the IEC

PD ASSESSMENT

IEC standard 62209-3

On the application of the PLANE-WAVE SPECTRUM for Power Density Assessment

2019.11.06
Helsinki, Finland

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

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IEC standard 62209-3

Technical advances On mmWave EMF Exposure measurement system

2019.11
Tokyo, Japan

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

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DAS

Considerations in Planar Near-Field Antenna Measurements for POWER DEnsity (PD) assessment at mmWave

2018.02.13
Plantation

Mehdi Ramdani

Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

Mathieu Chamaillard

R&D engineer, ART-Fi



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regulators

Proposed action plan for the development of the mmWave measurement standard IEC/IEEE 63195-1

2018.06
Paris, France


Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative


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SAR ASSESSMENT

IEC

Context and industrial need for the preparation of a Technical Report (TR) for the SAR assessment of 5G FR1 technologies

2019.11.06
Helsinki, Finland

Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

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IEC

Updates on Technical Report for 5G Sub 6 GHz

2019.11
Tokyo, Japan

Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

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IEC standard 62209-3

Time-averaging SAR procedure with ART-MAN

2016.05.24
Zürich, Switzerland

Ourouk Jawad
PhD, R&D Manager, ART-Fi


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SAR

Technical solution for Time-Averaging SAR measurements using RF vector measurement system

2017.02
Plantation

Mehdi Ramdani

Standard & Regulation Project Manager
IEC Member, French National Comitee Representative


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SAR system measurement

Efficient Procedure For The Assessment of the Actual EMF Exposure Level From Active MIMO Devices ; Application of Vector Field Based Measurement System

2019.11.06
Kista, Sweden

Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

Thomas Julien
Chief Technical Officer, ART-Fi

Ourouk Jawad
PhD, R&D Manager, ART-Fi


Philippe Giry
Technical Engineer, ART-Fi

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5G

On the accuracy of standard measurement protocols for fields with high normal E-field contribution (Part-1)

2016.05

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative


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ANFR

On the Accuracy of Standard Measurement Protocols for Fields with High Normal E-Field Contribution (Part-2)

2016.30.10
Hangzhou, China

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

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tests laboratories

CDV 62209-3: evaluating the robustness of system validation procedur

2017.10
Melbourne, Australia


Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative


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antenna designers

Technical review of newly introduced dipole antennas for the system validation in the unified Standard

2019.03.27
New Jersey, USA


Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative


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sar measurement

Method of transfer calibration of validation antennas using the vector array as the measurement device

2018.02
Plantation

Mehdi Ramdani

Standard & Regulation Project Manager
IEC Member, French National Comitee Representative


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sar system

Background and proposal for requirements on near-field reconstruction

2016.05
Zurich, Sweden

Lyazid Aberbour

PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

Andrea Cozza
Centrale Supelec, Electromagnetics Research DPT


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SAR testing

Impact of the antenna input impedance mismatch on SAR

Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative


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FCC

Technical proposal of analytical reference functions for the evaluation of the reconstruction algorithm and its uncertainty

2016.26.10
Hangzhou, China

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

Mathieu Chamaillard
R&D engineer, ART-Fi
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mobile phone

Impact of the DUT holder on the peak-spatial average SAR

2016.05.23
Zürich, Switzerland

Mehdi Ramdani

Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

Philippe Giry
Technical Engineer, ART-Fi

Romain Ferrier
Product owner


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precision measurement

Technical proposal to strengthen the system validation procedure and associated antennas

2017.05
London, UK

Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative

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test lab

Technical proposal for performance oriented system check and system validation

2015.10
Venice, Italia

Benoît Derat


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specific absorption rate

Technical proposal of statistical method applied to system validation criteria

2016.30.10
Hangzhou, China

Andrea Cozza
Centrale Supelec, Electromagnetics Research DPT
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network operators

Evaluation of the numerical SAR targets of the system validation procedure; focus on the vPIFA antennas

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative

Mehdi Ramdani
Standard & Regulation Project Manager
IEC Member, French National Comitee Representative


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IEC standard 62209-1

Validation of Numerical Targets of vPIFA

2019.30.04
London, UK

Mehdi Ramdani
Standard & Regulation Project Manager, ART-Fi
IEC Member, French National Comitee Representative

Lyazid Aberbour
PhD, Chief Scientific Officer, ART-Fi
IEC Member, French National Comitee Representative


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mobile technology

EMF EXPOSURE PROBE ARRAY SYSTEM

2018.10
Baltimore, US

Ourouk Jawad
PhD, R&D Manager, ART-Fi


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ABOUT ART-FI 
High precision solution for Specific Absorption Rate (SAR) testing & measurement. SAR measurement solutions. Manufactured in France. Precise SAR testing services.  SAR Testing for IEC and FCC | SAR Compliance Testing. ART-Fi provides solutions to accelerate wireless regulatory compliance across development, pre-compliance testing, and certification using innovative electromagnetic field measurement technologies. ART-Fi also offers professional services for antenna design, development, and 3D-EM simulation. All ART-MAN systems are manufactured in France. Solutions de mesures de haute précision du débit d'absorption spécifique (DAS).  

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   Contact ART-Fi
   2 rue Jacques Monod
   91400 ORSAY, FRANCE

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