IEC 62209-3 meeting in Paris on May 12 - 15, 2015 | Hosted by Art-Fi

ART-Fi is proud to host the upcoming IEC 62209-3 meeting in Paris, May 12 – May 15.

IEC 62209-3 is meant to include a new series of normative requirements for “Fast SAR” technologies based on vector field probes and probe-arrays.

This will complement series 62209-1, 62209-2 standards based on amplitude-only field measurements.

Between now and then, work will focus on developing:

  • Uncertainty requirements for vector probe array and vector probe measurements
  • Calibration requirements
  • System validation requirements

We will keep you updated on the progress of IEC 62209-3!

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ART-Fi is a pioneer of the new generation of fast SAR systems designed for compliance testing which fall in the scope of 62209-3.

Using the ART-MAN Fast SAR measurement system, a 2D electric field scan is performed, and then a 3D field distribution is reconstructed by computing propagation functions. Fast SAR not only makes SAR faster and eliminates the need for a robot, it also enables a more advanced application of array systems.


About ART-Fi

ART-Fi provides solutions to accelerate wireless regulatory compliance across development, pre-compliance testing, and certification using innovative electromagnetic field measurement technologies.

ART-Fi also offers professional services for antenna design, development, and 3D-EM simulation.

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